TECHAMERICA Collection
This collection contains documents from the following standards organization(s): TechAmerica 1 2 > >
| TECHAMERICA AB 3-D | EN-Glossary of Terms for Numerically Controlled Machines | |
| TECHAMERICA CMB 4-2 | EN-Configuration Identification for Digital Computer Programs | |
| TECHAMERICA CMB 4-3 | EN-Computer Software Libraries | |
| TECHAMERICA CMB 4-4 | EN-Configuration Change Control for Digital Computer Programs | |
| TECHAMERICA CMB 5-A | EN-Configuration Management Requirements for Subcontractors/Vendors | |
| TECHAMERICA CMB 6-10 | EN-Education in Configuration and Data Management | |
| TECHAMERICA CMB 6-1C | EN-Configuration and Data Management References | |
| TECHAMERICA CMB 6-2 | EN-Configuration and Data Management In-House Training Plan | |
| TECHAMERICA CMB 6-3 | EN-Configuration Identification | |
| TECHAMERICA CMB 6-4 | EN-Configuration Control | |
| TECHAMERICA CMB 6-5 | EN-Textbook for Configuration Status Accounting | |
| TECHAMERICA CMB 6-6 | EN-Reviews and Configuration Audits | |
| TECHAMERICA CMB 6-8 | EN-Data Management In-House Training Course | |
| TECHAMERICA CMB 6-9 | EN-Configuration and Data Management Training Course | |
| TECHAMERICA CMB 7-1 | EN-Electronic Interchange of Configuration Management Data | |
| TECHAMERICA CMB 7-2 | EN-Guideline for Transitioning Configuration Management to an Automated Environment | |
| TECHAMERICA CMB 7-3 | EN-CALS Configuration Management SOW and CDRL Guidance | |
| TECHAMERICA CMB 7-4 | EN-Glossary of Terms Acronyms and Definitions | |
| TECHAMERICA CYBERSTATES | EN-A complete state-by-state overview of the high-technology industry | |
| TECHAMERICA DMG-1 | EN-Data Management Implementation Guide | |
| TECHAMERICA DMG-2 | EN-Automated Data Management Guideline | |
| TECHAMERICA EDIB1-B | EN-Engineering Design Integration Bulletin No. 1-B Unit Production Cost Tracking Model UPCT6 | |
| TECHAMERICA EDIF 1 | EN-Introduction to EDIF Monograph Series-Volume 1 | |
| TECHAMERICA EDIF 2 | EN-EDIF Connectivity Monograph Series-Volume 2 | |
| TECHAMERICA EDIF/AG-1 | EN-Applications Guide Using EDIF 2 0 0 for Schematic Transfer | |
| TECHAMERICA EIA 557-B | EN-STATISTICAL PROCESS CONTROL SYSTEMS | |
| TECHAMERICA EIA-227-A | EN-One-Inch Perforated Tape | |
| TECHAMERICA EIA-267-C | EN-Axis and Motion Nomenclature for Numerically Controlled Machines | |
| TECHAMERICA EIA-274-D | EN-Interchangeable Variable Block Data Format for Positioning Contouring and Contouring/Positioning Numerically Controlled Machines | |
| TECHAMERICA EIA-358-C | EN-American National Standard Code for Information Interchange for Numerical Machine Control | |
| TECHAMERICA EIA-408 | EN-Interface between Numerical Control Equipment and Data Terminal Equipment Employing Parallel Binary Data Interchange-Includes Errata: 08/13/1973 | |
| TECHAMERICA EIA-431 | EN-Electrical Interface between Numerical Control and Machine Tools | |
| TECHAMERICA EIA-441 | EN-Operator Interface Functions of Numerical Controls | |
| TECHAMERICA EIA-484-A | EN-Electrical and Mechanical Interface Characteristics and Line Control Protocol Using Communication Control Characters for Serial Data Link between a Direct Numerical Control System and Numerical Control Equipment Empl | |
| TECHAMERICA EIA-491 | EN-Interface between a Numerical Control Unit and Peripheral Equipment Employing Asynchronous Binary Data Interchange over Circuits Having RS-423-A Electrical Characteristics | |
| TECHAMERICA EIA-494-B | EN-32 Bit Binary CL (BCL) and 7 Bit ASCII CL (ACL) Exchange Input Format for Numerically Controlled Machines | |
| TECHAMERICA EIA-511 | EN-Manufacturing Message Specification - Service Definition and Protocol (ISO 9506)-Includes Errata: 04/18/1989 | |
| TECHAMERICA EIA-548 | EN-Electronic Design Interchange Format Version 2 0 0 | |
| TECHAMERICA EIA-554 SET | EN-Method Selection for Assessment of Nonconforming Levels in Parts per Million (PPM) - Includes EIA-554-1 EIA-554-2 and EIA-554-A | |
| TECHAMERICA EIA-555 | EN-Lot Acceptance Procedure for Verifying Compliance with the Specified Quality Levels (SQL) in PPM-Annex to SSB-1 Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military Aerospace and O | |
| TECHAMERICA EIA-584 | EN-Zero Acceptance Number Sampling Procedures and Tables for Inspection by Attributes of a Continuous Manufacturing Process | |
| TECHAMERICA EIA-585 | EN-Zero Acceptance Number Sampling Procedures and Tables for Inspection by Attributes of Isolated Lots | |
| TECHAMERICA EIA-591 | EN-Assessment of Quality Levels in PPM Using Variables Test Data | |
| TECHAMERICA EIA-599-A | EN-National Electronic Process Certification Standard | |
| TECHAMERICA EIA-601-A | EN-General Procedure for Capability Approval of Electronic Components | |
| TECHAMERICA EIA-618 | ||
| TECHAMERICA EIA-632 | EN-Processes for Engineering a System | |
| TECHAMERICA EIA-649 DRAFT | EN-National Consensus Standard for Configuration Management-To be published as ANSI/EIA 649-B | |
| TECHAMERICA EIA-649-A | EN-National Consensus Standard for Configuration Management | |
| TECHAMERICA EIA-681 | EN-Assessment Guide for Process Certification | |
| TECHAMERICA EIA-682 | ||
| TECHAMERICA EIA-731.1 | EN-Systems Engineering Capability Model | |
| TECHAMERICA EIA-731.2 | EN-Systems Engineering Capability Model Appraisal Method | |
| TECHAMERICA EIA-738 | EN-Guideline on the Use and Application of Cpk | |
| TECHAMERICA EIA-748-B | EN-Earned Value Management Systems | |
| TECHAMERICA EIA-765-A | EN-International and National Quality Standards Index | |
| TECHAMERICA EIA-830 | EN-Model for Integrating Metrics into the Procurement Process | |
| TECHAMERICA EIA-832 | EN-Process Improvement Guidelines | |
| TECHAMERICA EIA-836B | EN-Configuration Management Data Exchange and Interoperability-Includes Additional Content | |
| TECHAMERICA EIA-933 | EN-Standard for Preparing a COTS Assembly Management Plan | |
| TECHAMERICA EIA-933 DRAFT | EN-Standard for Preparing a COTS Assembly Management Plan-To be published as GEIA EIA-933-A | |
| TECHAMERICA EIA-IS-103-A | EN-Library of Parameterized Modules (LPM)-Version 2 1 0 | |
| TECHAMERICA EIA-STD-656-B | EN-I/O Buffer Information Specification (IBIS) Version 4.2 | |
| TECHAMERICA EIA/IS-106 | EN-CDIF - CASE Data Interchange Format - Overview-Interim Standard | |
| TECHAMERICA EIA/IS-107 | EN-CDIF - Framework for Modeling and Extensibility-Interim Standard | |
| TECHAMERICA EIA/IS-108 | EN-CDIF - Transfer Format General Rules for Syntaxes and Encodings-Interim Standard | |
| TECHAMERICA EIA/IS-109 | EN-CDIF - Transfer Format Syntax SYNTAX.1-Interim Standard | |
| TECHAMERICA EIA/IS-110 | EN-CDIF - Transfer Format Encoding ENCODING.1-Interim Standard | |
| TECHAMERICA EIA/IS-111 | EN-CDIF - Integrated Meta-Model Foundation Subject Area-Interim Standard | |
| TECHAMERICA EIA/IS-112 | EN-CDIF Integrated Meta-model Common Subject Area-Interim Standard | |
| TECHAMERICA EIA/IS-114 | EN-CDIF Integrated Meta-model Data Modeling Subject Area-Interim Standard | |
| TECHAMERICA EIA/IS-115 | EN-CDIF Integrated Meta-model Data Flow Model Subject Area-Interim Standard | |
| TECHAMERICA EIA/IS-116 | EN-CDIF Integrated Meta-model - State/Event Model Subject Area | |
| TECHAMERICA EIA/IS-118 | EN-CDIF - Integrated Meta-Model - Presentation Location and Connectivity Subject Area-Interim Standard | |
| TECHAMERICA EIA/IS-734 | ||
| TECHAMERICA EMCB 1-1 | EN-Historical Rationale for Military EMI Limits-Best Copy Available | |
| TECHAMERICA GEB1 | EN-Diminishing Manufacturing Sources and Material Shortages (DMSMS) Management Practices | |
| TECHAMERICA GEIA HB-748-1 | EN-Handbook: The Program Managers´ Guide to the Integrated Baseline Review Process | |
| TECHAMERICA GEIA-4900 | EN-Use of Semiconductor Devices Outside Manufacturers´ Specified Temperature Ranges |
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