EUROFILE - Electronics Telecommunications IT Transportation Aerospace Collection
This collection contains documents from the following standards organization(s): European Committee for Electrotechnical Standardization, European Committee for Standardization
| CENELEC EN 60384-13 | EN-Fixed capacitors for use in electronic equipment Part 13: Sectional specification - Fixed polypropylene film dielectric metal foil d.c. capacitors-Incorporating corrigendum November 2006 | |
| CENELEC EN 60384-13-1 | EN-Fixed capacitors for use in electronic equipment Part 13-1: Blank detail specification - Fixed polypropylene film dielectric metal foil d.c. capacitors - Assessment level E | |
| CENELEC EN 60384-14 | EN-Fixed capacitors for use in electronic equipment Part 14: Sectional specification - Fixed capacitors for electromagnetic interference suppression and connection to the supply mains | |
| CENELEC EN 60384-14-1 | EN-Fixed capacitors for use in electronic equipment Part 14-1: Blank detail specification - Fixed capacitors for electromagnetic interference suppression and connection to the supply mains - Assessment level D-IEC 6 | |
| CENELEC EN 60384-14-2 | EN-Fixed capacitors for use in electronic equipment Part 14-2: Blank detail specification Fixed capacitors for electromagnetic interference suppression and connection to the supply mains Safety tests only-IEC 60384- | |
| CENELEC EN 60384-14-3 | EN-Fixed capacitors for use in electronic equipment Part 14-3: Blank detail specification Fixed capacitors for electromagnetic interference suppression and connection to the supply mains Assessment level DZ-IEC 6038 | |
| CENELEC EN 60384-16 | EN-Fixed capacitors for use in electronic equipment Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c. capacitors | |
| CENELEC EN 60384-16-1 | EN-Fixed capacitors for use in electronic equipment Part 16-1: Blank detail specification: Fixed metallized polypropylene film dielectric d.c. capacitors - Assessment levels E and EZ | |
| CENELEC EN 60384-17 | EN-Fixed capacitors for use in electronic equipment Part 17: Sectional specification: Fixed metallized polypropylene film dielectric a.c. and pulse capacitors-IEC 60384-17: 2005 | |
| CENELEC EN 60384-17-1 | EN-Fixed capacitors for use in electronic equipment Part 16-1: Blank detail specification: Fixed metallized polypropylene film dielectric d.c. capacitors - Assessment levels E and EZ-IEC 60384-17-1:2005 | |
| CENELEC EN 60384-18 | EN-Fixed capacitors for use in electronic equipment - Part 18: Sectional specification - Fixed aluminium electrolytic surface mount capacitors with solid (MnO2) and non-solid electrolyte | |
| CENELEC EN 60384-18-1 | EN-Fixed capacitors for use in electronic equipment - Part 18-1: Blank detail specification - Fixed aluminium electrolytic surface mount capacitors with solid (MnO2) electrolyte - Assessment level EZ | |
| CENELEC EN 60384-18-2 | EN-Fixed capacitors for use in electronic equipment - Part 18-2: Blank detail specification - Fixed aluminium electrolytic surface mount capacitors with non-solid electrolyte - Assessment level EZ | |
| CENELEC EN 60384-19 | EN-Fixed capacitors for use in electronic equipment Part 19: Sectional specification - Fixed metallized polyethylene-terephthalate film dielectric surface mount d.c. capacitors-Incorporates Corrigendum: November 2006 | |
| CENELEC EN 60384-19-1 | EN-Fixed capacitors for use in electronic equipment Part 19-1: Blank detail specification - Fixed metallized polyethylene-terephthalate film dielectric surface mount d.c. capacitors - Assessment level EZ-Incorporating c | |
| CENELEC EN 60384-2 | EN-Fixed capacitors for use in electronic equipment Part 2: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors-Supersedes CECC 30 400:1984 | |
| CENELEC EN 60384-2-1 | EN-Fixed capacitors for use in electronic equipment Part 2-1: Blank detail specification: Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors Assessment levels E and EZ | |
| CENELEC EN 60384-20 | EN-Fixed capacitors for use in electronic equipment - Part 20: Sectional specification - Fixed metallized polyphenylene sulfide film dielectric surface mount d.c. capacitors | |
| CENELEC EN 60384-20-1 | EN-Fixed capacitors for use in electronic equipment - Part 20-1: Blank detail specification - Fixed metallized polyphenylene sulfide film dielectric surface mount d.c. capacitors - Assessment level EZ | |
| CENELEC EN 60384-21 | EN-Fixed capacitors for use in electronic equipment Part 21: Sectional specification: Fixed surface mount multilayer capacitors of ceramic dielectric Class 1 | |
| CENELEC EN 60384-21-1 | EN-Fixed capacitors for use in electronic equipment Part 21-1: Blank detail specification: Fixed surface mount multilayer capacitors of ceramic dielectric Class 1 Assessment level EZ | |
| CENELEC EN 60384-22 | EN-Fixed capacitors for use in electronic equipment Part 22: Sectional specification: Fixed surface mount multilayer capacitors of ceramic dielectric Class 2 | |
| CENELEC EN 60384-22-1 | EN-Fixed capacitors for use in electronic equipment Part 22-1: Blank detail specification: Fixed surface mount multilayer capacitors of ceramic dielectric Class 2 Assessment level EZ | |
| CENELEC EN 60384-23 | EN-Fixed capacitors for use in electronic equipment Part 23: Sectional specification - Fixed surface mount metallized polyethylene naphthalate film dielectric DC capacitors | |
| CENELEC EN 60384-23-1 | EN-Fixed capacitors for use in electronic equipment Part 23-1: Blank detail specification - Fixed surface mount metallized polyethylene naphthalate film dielectric DC capacitors - Assessment level EZ | |
| CENELEC EN 60384-24 | EN-Fixed capacitors for use in electronic equipment Part 24: Sectional specification - Surface mount fixed tantalum electrolytic capacitors with conductive polymer solid electrolyte-IEC 60384-24: 2006 | |
| CENELEC EN 60384-24-1 | EN-Fixed capacitors for use in electronic equipment Part 24-1: Blank detail specification - Surface mount fixed tantalum electrolytic capacitors with conductive polymer solid electrolyte - Assessment level EZ-IEC 60 | |
| CENELEC EN 60384-25 | EN-Fixed capacitors for use in electronic equipment Part 25: Sectional specification - Surface mount fixed aluminium electrolytic capacitors with conductive polymer solid electrolyte-IEC 60384-25:2006 | |
| CENELEC EN 60384-25-1 | EN-Fixed capacitors for use in electronic equipment Part 25-1: Blank detail specification - Surface mount fixed aluminium electrolytic capacitors with conductive polymer solid electrolyte - Assessment level EZ-IEC 6 | |
| CENELEC EN 60384-3 | EN-Fixed capacitors for use in electronic equipment Part 3: Sectional specification: Surface mount fixed tantalum electrolytic capacitors with manganese dioxide solid electrolyte-Incorporating corrigendum April 2009 | |
| CENELEC EN 60384-3-1 | EN-Fixed capacitors for use in electronic equipment Part 3-1: Blank detail specification: Surface mount fixed tantalum electrolytic capacitors with manganese dioxide solid electrolyte - Assessment level EZ-Incorporating | |
| CENELEC EN 60384-4 | EN-Fixed capacitors for use in electronic equipment - Part 4: Sectional specification - Aluminium electrolytic capacitors with solid (MnO2) and non-solid electrolyte | |
| CENELEC EN 60384-4-1 | EN-Fixed capacitors for use in electronic equipment - Part 4-1: Blank detail specification - Fixed aluminium electrolytic capacitors with non-solid electrolyte - Assessment level EZ-Incorporating Corrigendum April 2009 | |
| CENELEC EN 60384-4-2 | EN-Fixed capacitors for use in electronic equipment - Part 4-2: Blank detail specification - Fixed aluminium electrolytic capacitors with solid (MnO2) electrolyte - Assessment level EZ-Incorporating Corrigendum April 20 | |
| CENELEC EN 60384-6 | EN-Fixed capacitors for use in electronic equipment Part 6: Sectional specification - Fixed metallized polycarbonate film dielectric d.c. capacitors | |
| CENELEC EN 60384-6-1 | EN-Fixed capacitors for use in electronic equipment Part 6-1: Blank detail specification - Fixed metallized polycarbonate film dielectric d.c. capacitors - Assessment level E | |
| CENELEC EN 60384-8 | EN-Fixed capacitors for use in electronic equipment Part 8: Sectional specification: Fixed capacitors of ceramic dielectric Class 1 | |
| CENELEC EN 60384-8-1 | EN-Fixed capacitors for use in electronic equipment Part 8-1: Blank detail specification: Fixed capacitors of ceramic dielectric Class 1 Assessment level EZ | |
| CENELEC EN 60384-9 | EN-Fixed capacitors for use in electronic equipment Part 9: Sectional specification: Fixed capacitors of ceramic dielectric Class 2 | |
| CENELEC EN 60384-9-1 | EN-Fixed capacitors for use in electronic equipment Part 9-1: Blank detail specification: Fixed capacitors of ceramic dielectric Class 2 Assessment level EZ | |
| CENELEC EN 60393-1 | EN-Potentiometers for use in electronic equipment - Part 1: Generic specification | |
| CENELEC EN 60444-1 | EN-Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase T | |
| CENELEC EN 60444-2 | EN-Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units | |
| CENELEC EN 60444-3 | EN-Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 3: Basic Method for the Measurement of Two-Terminal Parameters of Quartz Crystal Units up to 200 MHz by Phase Technique in a | |
| CENELEC EN 60444-5 | EN-Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction | |
| CENELEC EN 60444-6 | EN-Measurement of Quartz Crystal Unit Parameters Part 6: Measurement of Drive Level Dependence (DLD) | |
| CENELEC EN 60444-7 | EN-Measurement of quartz crystal unit parameters Part 7: Measurement of activity and frequency dips of quartz crystal units-IEC 60444-7:2004 | |
| CENELEC EN 60444-8 | EN-Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units-IEC 60444-8:2003 | |
| CENELEC EN 60444-9 | EN-Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units | |
| CENELEC EN 60461 | EN-Time and Control Code for Video Tape Recorders-IEC 60461:2001; Supersedes HD 507 S1:1988 | |
| CEN EN 6049-002 | EN-Aerospace series - Electrical cables installation - Protection sleeve in meta-aramid fibres - Part 002: General and list of product standards | |
| CEN EN 6049-003 | EN-Aerospace series - Electrical cables installation - Protection sleeve in meta-aramid fibres - Part 003: Braided tubular expandable - Product standard | |
| CENELEC EN 60495 | EN-Single Sideband Power-Line Carrier Terminals (IEC 495 : 1993) | |
| CENELEC EN 60503 | EN-Spools for Broadcast Videotape Recorders (VTRS)-IEC 60503:1998 | |
| CENELEC EN 60510-2-5 | EN-Methods of Measurement for Radio Equipment Used in Satellite Earth Stations Part 2: Measurements for Sub-Systems Section Five: Frequency Modulators (IEC 510-2-5 : 1992) | |
| CENELEC EN 60510-2-6 | EN-Methods of Measurement for Radio Equipment Used in Satellite Earth Stations Part 2: Measurements for Sub-Systems Section Six: Frequency Demodulators (IEC 510-2-6 : 1992) | |
| CENELEC EN 60510-3-4 | EN-Methods of Measurement for Radio Equipment Used in Satellite Earth Stations Part 3: Methods of Measurement on Combinations of Sub- Systems Section Four: Measurements for Frequency Division Multiplex (f.d.m.) Transmis | |
| CENELEC EN 60512-1 | EN-Connectors for Electronic Equipment - Tests and Measures Part 1: General-IEC 60512-1:2001 | |
| CENELEC EN 60512-1-1 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 1-1: General Examination - Test 1a: Visual Examination-IEC 60512-1-1:2002 | |
| CENELEC EN 60512-1-100 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 1-100: General - Applicable Publications-IEC 60512-1-100:2006 | |
| CENELEC EN 60512-1-2 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 1-2: General Examination - Test 1b: Examination of Dimensions and Mass-IEC 60512-1-2: 2002 | |
| CENELEC EN 60512-1-3 | EN-Electromechanical Components for Electronic Equipment Basic Testing Procedures and Measuring Methods Part 1: General Examination Section 3: Test 1c - Electrical Engagement Length-IEC 60512-1-3: 1997 | |
| CENELEC EN 60512-1-4 | EN-Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 1: General - Section 4: Test 1d: Contact Protection Effectiveness (Scoop-Proof) | |
| CENELEC EN 60512-10-4 | EN-Connectors for electronic equipment Tests and measurements Part 10-4: Impact tests (free components) static load tests (fixed components) endurance tests and overload tests Test 10d: Electrical overload (connec | |
| CENELEC EN 60512-11-1 | EN-Electromechanical Components for Electronic Equipment Basic Testing Procedures and Measuring Methods Part 11: Climatic Tests Section 1: Test 11a - Climatic Sequence-IEC 60512-11-1: 1995 | |
| CENELEC EN 60512-11-10 | EN-Connectors for Electronic Equipment - Tests and Measurements - Part 11-10: Climatic Tests - Test 11j: Cold-IEC 60512-11-10:2002 | |
| CENELEC EN 60512-11-11 | EN-Connectors for Electronic Equipment - Tests and Measurements - Part 11-11: Climatic Tests - Test 11k: Low Air Pressure-IEC 60512-11-11: 2002 | |
| CENELEC EN 60512-11-12 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 11-12: Climatic Tests - Test 11m: Damp Heat Cyclic-IEC 60512-11-12: 2002 | |
| CENELEC EN 60512-11-13 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 11-13: Climatic Tests - Test 11n: Gas Tightness Solderless Wrapped Connections-IEC 60512-11-13: 2002 | |
| CENELEC EN 60512-11-14 | EN-Connectors for electronic equipment Tests and measurements Part 11-14: Climatic tests Test 11p: Flowing single gas corrosion test-IEC 512-11-14:2003 | |
| CENELEC EN 60512-11-2 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 11-2: Climatic Tests - Test 11b: Combined/Sequential Cold Low Air Pressure and Damp Heat-IEC 60512-11-2: 2002 | |
| CENELEC EN 60512-11-3 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 11-3: Climatic Tests - Test 11c: Damp Heat Steady State-IEC 60512-11-3: 2002 | |
| CENELEC EN 60512-11-4 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 11-4: Climatic Tests - Test 11d: Rapid Change of Temperature-IEC 60512-11-4: 2002 | |
| CENELEC EN 60512-11-5 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 11-5: Climatic Tests - Test 11e: Mould Growth-IEC 60512-11-5: 2002 | |
| CENELEC EN 60512-11-6 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 11-6: Climatic Tests - Test 11f: Corrosion Salt Mist-IEC 60512-11-6: 2002 | |
| CENELEC EN 60512-11-7 | EN-Connectors for electronic equipment - Tests and measurements Part 11- 7: Climatic tests - Test 11g: Flowing mixed gas corrosion test-IEC 60512-11-7:2003 | |
| CENELEC EN 60512-11-9 | EN-Connectors for Electronic Equipment - Tests and Measurements Part 11-9: Climatic Tests - Test 11i: Dry Heat-IEC 60512-11-9: 2002 | |
| CENELEC EN 60512-12-1 | EN-Connectors for electronic equipment - Tests and measurements Part 12-1: Soldering tests - Test 12a: Solderability wetting solder bath method-IEC 60512-12-1:2006 | |
| CENELEC EN 60512-12-2 | EN-Connectors for electronic equipment - Tests and measurements Part 12-2: Soldering tests - Test 12b: Solderability wetting soldering iron method-Incorporating corrigendum December 2006 |