BSI - Electronic Components of Assessed Quality Collection
This collection contains documents from the following standards organization(s): British Standards Institution
| BSI BS 123100 | EN-System of Quality Assessment - Sectional Specification - Rigid Single-Sided Printed Boards with Plain Holes | |
| BSI BS 123100-003 | EN-System of Quality Assessment - Capability Detail Specification - Rigid Single-Sided and Double-Sided Printed Boards with Plain Holes | |
| BSI BS 123200 | EN-System of Quality Assessment - Sectional Specification - Rigid Double-Sided Printed Boards with Plated-Through Holes | |
| BSI BS 123200-003 | EN-System of Quality Assessment - Capability Detail Specification - Rigid Double-Sided Printed Boards with Plated-Through Holes | |
| BSI BS 123300 | EN-System of Quality Assessment - Sectional Specification - Rigid Multilayer Printed Boards | |
| BSI BS 123300-003 | EN-System of Quality Assessment - Capability Detail Specification - Rigid Multilayer Printed Boards | |
| BSI BS 123400 | EN-System of Quality Assessment - Sectional Specification - Flexible Single-Sided and Double-Sided Printed Boards without Through-Connections | |
| BSI BS 123400-003 | EN-System of Quality Assessment - Capability Detail Specification - Flexible Single-Sided and Double-Sided Printed Boards without Through-Connections | |
| BSI BS 123500 | EN-System of Quality Assessment - Sectional Specification - Flexible Single-Sided and Double-Sided Printed Boards with Through-Connections | |
| BSI BS 123500-003 | EN-System of Quality Assessment - Capability Detail Specification - Flexible Single-Sided and Double-Sided Printed Boards with Through-Connections | |
| BSI BS 123600 | EN-System of Quality Assessment - Sectional Specification - Flex-Rigid Multilayer Printed Boards with Through-Connections | |
| BSI BS 123600-003 | EN-System of Quality Assessment - Capability Detail Specification - Flex-Rigid Multilayer Printed Boards with Through-Connections | |
| BSI BS 123700 | EN-System of Quality Assessment - Sectional Specification - Flex-Rigid Double-Sided Printed Boards with Through-Connections | |
| BSI BS 123700-003 | EN-System of Quality Assessment - Capability Detail Specification - Flex-Rigid Double-Sided Printed Boards with Through-Connections | |
| BSI BS 123800 | EN-System of Quality Assessment - Sectional Specification - Flexible Multilayer Printed Boards with Through-Connections | |
| BSI BS 123800-003 | EN-System of Quality Assessment - Capability Detail Specification - Flexible Multilayer Printed Boards with Through-Connections | |
| BSI BS 4N 100-1 | EN-Aircraft oxygen systems and equipment - Part 1: Design and installation-AMD 15951: October 2005; AMD 17217: July 31 2007 | |
| BSI BS 4N 100-2 | EN-Aircraft oxygen systems and equipment Part 2: Tests for the compatibility of materials in the presence of oxygen-AMD 13414: February 4 2002; AMD 15357: October 31 2005 | |
| BSI BS 4N 100-3 | EN-Aircraft oxygen systems and equipment Part 3: Testing of equipment and systems-AMD 14906: March 1 2004 | |
| BSI BS 4N 100-6 | EN-Aircraft oxygen systems and equipment Ð Part 6: Guidance and recommendations on the selection of materials for use with oxygen | |
| BSI BS 9000-1 | EN-General requirements for a system for electronic components of assessed quality - Part 1: Specification of general procedures | |
| BSI BS 9000-2 | EN-General Requirements for a System for Electronic Components of Assessed Quality Part 2: Specification for the National Implementation of the CECC System (T) | |
| BSI BS 9000-3 | EN-General Requirements for a System for Electronic Components of Assessed Quality Part 3: Specification for the National Implementation of the IECQ System | |
| BSI BS 9000-4 | EN-General Requirements for a System for Electronic Components of Assessed Quality - Part 4: Specification of Procedures for the Approval of an Organization | |
| BSI BS 9000-5 | EN-General Requirements for Electronic Components of Assessed Quality - Part 5: Speciffication for Qualification Approval and Conformance Testing Procedures | |
| BSI BS 9000-6 | EN-General requirements for a system for electronic components of assessed quality - Part 6: Specification of capability approval procedures | |
| BSI BS 9000-7 | EN-General requirements for a system for electronic components of assessed quality - Part 7: Specification of lot formation release procedures and certified test records | |
| BSI BS 9030 | EN-Specification for Magnetrons of Assessed Quality: Generic Data and Methods of Test-Amd 987; AMD 3592: January 29 1982 | |
| BSI BS 9031 | EN-Rules for the Preparation of Detail Specifications for Pulsed Fixed-Frequency Magnetrons of Assessed Quality-AMD 1131: March 1973; AMD 1727: April 1975 | |
| BSI BS 9032 | EN-Rules for the Preparation of Detail Specifications for Pulsed Magnetrons (Excluding Frequency- Agile Magnetrons) of Assessed Quality. Basic Assessment Level | |
| BSI BS 9040 | EN-Gas-Filled Microwave Switching Tubes of Assessed Quality: Generic Data and Methods of Test | |
| BSI BS 9041 | EN-Rules for the Preparation of Detail Specifications for Gas- Filled Microwave Switching Tubes of Assessed Quality: Tunable and Broadband TR Tubes and TR Tunable and Broadband Tubes and TR Limiters Full Assessment Leve | |
| BSI BS 9050 | EN-Specification for cathode ray tubes of assessed quality: generic data and methods of test-AMD 1137: April 1973; AMD 1628: February 1975; AMD 2266: September 1977 | |
| BSI BS 9054 | EN-Rules for the Preparation of Detail Specifications for Radar Display Cathode Ray Tubes of Assessed Quality-AMD 2252: April 1977; AMD 2596: May 1978; AMD 3439: November 1980 | |
| BSI BS 9070 N002 | EN-Fixed Capacitors of Assessed Quality: Generic Data and Methods of Test N0002: Detail Specification for Fixed Mica Dielectric Capacitors of Assessed Quality: Style C2AED. General Application Category-Amd 1685:Oktober | |
| BSI BS 9070 N003 | EN-Detail specification for fixed metallized mica dielectric capacitors (style C2AEA). Rectangular non-metallic case axial wires at both ends. General application category-Amd 1684: October 1975 | |
| BSI BS 9070-1 & 2 | EN-Specification for fixed capacitors of assessed quality: generic data and methods of test. Principles and mandatory procedures. General rules for drafting detail specifications-AMD 1294: March 1974; AMD 2308: July 197 | |
| BSI BS 9070-3 | EN-Fixed Capacitors of Assessed Quality: Generic Data and Methods of Test Section 3: Tantalum Electrolytic Capacitors-AMD 1513: July 1974; AMD 2094 September 1976; AMD 2365: October 1977; AMD 3574: May 1981; AMD 3970: | |
| BSI BS 9070-4 | EN-Specification for fixed capacitors of assessed quality: generic data and methods of test. Polystyrene dielectric capacitors-AMD 1514: July 1974; AMD 1666: February 1975; AMD 3800: May 1982; AMD 7395: March 1993 | |
| BSI BS 9070-5 | EN-Specification for fixed capacitors of assessed quality: generic data and methods of test. Ceramic dielectric capacitors-AMD 1431: May 1974; AMD 2063: August 1976; AMD 2366: October 1977; AMD 3315: November 1980; AMD | |
| BSI BS 9070-6 | EN-Specification for fixed capacitors of assessed quality: generic data and methods of test. Polycarbonate dielectric capacitors and polyethylene terephthalate dielectric capacitors for d.c. use and polypropylene dielec | |
| BSI BS 9070-7 | EN-Specification for fixed capacitors of assessed quality: generic data and methods of test. Mica dielectric capacitors-AMD 1433: May 1974; AMD 3577: May 1981; AMD 3803: April 1982; AMD 7398: March 1993 | |
| BSI BS 9073 N0034 | EN-Detail Specification for Fixed Capacitors Tantalum Electrolytic Porous Anode Polar Non-Solid Electrolyte Tubular Metallic Case Insulated PTFE/ Elastomer Seal Axial Wire Terminations. Full Plus Additional Asse | |
| BSI BS 9074 N002 | EN-Detail Specification for Fixed Polystyrene Foil Dielectric Capacitors Tubular Insulated Case Axial Terminations Full Assessment Level (AMD 7411) January 15 1993-AMD 1647: April 1975; AMD 3210: January 1980; AMD 386 | |
| BSI BS 9074 N007 | EN-Polystyrene film dielectric capacitors extended foil Rectangular non-metallic case unidirectional terminations Full plus additional assessment level-AMD 3862: December 1981; Supersedes BS 9074 N007: 1978 which r | |
| BSI BS 9075 N023 | EN-Detail specification for Fixed monolithic ceramic dielectric capacitors (type 1B) Rectangular non-metallic case centred wires on one face Full assessment level-AMD 3212: January 1980; AMD 3363: September 1980; AMD | |
| BSI BS 9075 N024 | EN-Detail Specification for Fixed Capacitors of Assessed Quality: Monolithic Ceramic Dielectric Type 2C1. Full Assessment-Amd 3364: September 1980; Amd 3836: December 1981 | |
| BSI BS 9076 N001 TO 004 | EN-Detail Specification for Fixed Metallized Polyethylene-Metallized Polycarbonate Film Dielectric Capacitors. Rectangular Non-Metallic Case Axial or Radial Terminations Centrally Spaced. Full Assessment-AMD 1681: Aug | |
| BSI BS 9100 | EN-Specification for capability approval for custom-built capacitors and capacitor modules: generic data and methods of test-AMD 7508: October 1993 | |
| BSI BS 9120 | EN-Radio Interference Suppression Filters of Assessed Quality: Generic Data and Methods of Test-AMD 7509: February 15 1993 | |
| BSI BS 9121 | EN-Blank detail specification for Radio Interference Suppression Filters of Assessed Quality Basic and Full Assessment Levels-AMD 7548: June 15 1993 | |
| BSI BS 9125 | EN-Specification for Capability Approval of Manufacturers of Passive Radio Interference Suppression Filter Units of Assessed Quality Generic Data-AMD 7510: February 15 1993 | |
| BSI BS 9130 | EN-Specification for Potentiometers of Assessed Quality: Generic Data and Methods of Test-AMD 1579: October 1974; AMD 1678: March 1975 | |
| BSI BS 9131 N001-N016 | EN-Detail Specification for Lead-Screw Actuated Wirewound or Non-Wirewound Preset Potentiometers Rectangular and Square Forms Container Sealed Actuating Device Insulated from Resistive Element Slipping Clutch at Each | |
| BSI BS 9133 | EN-Rules for the Preparation of Detail Specifications for Single Turn Low Power Rotary Potentiometers of Assessed Quality | |
| BSI BS 9133 N001-003 | EN-Detail specification for Single turn low power non-wirewound rotary potentiometers - Spindle insulated from resistance element spindle and panel sealed or container spindle and panel sealed - Full assessment le | |
| BSI BS 9150 | EN-Specification for Electrical Relays of Assessed Quality: Generic Data and Methods of Test-AMD 4688: December 1984 | |
| BSI BS 9151 | EN-Rules for the Preparation of Detail Specifications for All-Or-Nothing Electromechanical Relays of Assessed Quality - Full and Basic Assessment Levels-AMD 3191: November 1979; AMD 4237: February 1983 | |
| BSI BS 9210 | EN-Radio Frequency Connectors of Assessed Quality: Generic Data and Methods of Test-AMD 7654; July 15 1993; Replaced by BS CECC 22000: 1980 but Remains Current Due to Existing Approvals; | |
| BSI BS 9210 N001-1 | EN-Detail specification for radio frequency connectors (Type BNC) - Sealed soldered captive contact 50 Omega - Full assessment level | |
| BSI BS 9210 N007-1 | EN-Detail Specification for Radio Frequency Connectors (Type SMB) Unsealed Soldered Captive Contact 50 ohms (Snap-On Coupling) Part 1: Full Assessment Level. Ratings Ordering Information and Inspection Reqirements | |
| BSI BS 9210 N007-2 | EN-Detail Specification for Radio Frequency Connectors (Type SMB) Unsealed Soldered Captive Contact 50 Ohms (Snap-On Coupling) Part 2: Full Assessment Level. Control Drawings. Mating Face Details and Gauge Informatio | |
| BSI BS 9210 N009-1 | EN-Detail Specification for Components of Assessed Quality Soldered Part 1: R.F. Connectors (Series SMC) Unsealed Soldered Captive Contact 50 Ohms (Screw Coupling) N0009: Full Assessment Level. Ratings Ordering I | |
| BSI BS 9210 N009-2 | EN-Detail Specification for Electronic Components of Assessed Quality Soldered Part 2: Control Drawings Mating Face Details and Gauge Information | |
| BSI BS 9220 | EN-Specification for Rigid Waveguide Tubing of Assessed Quality: Generic Data and Methods of Test-AMD 4103: December 31 1982 | |
| BSI BS 9220 N001 | EN-Detail Specification for Rigid Waveguide Tubing Ordinary Rectangular (2:1) of Assessed Quality General Application Category | |
| BSI BS 9220 N002 | EN-Detail Specification for Medium Flat Rectangular Waveguide (4:1) of Assessed Quality. General Application Category | |
| BSI BS 9220 N003 | EN-Detail Specification for Flat Rectangular Waveguide (8.33:1) of Assessed Quality. General Application Category | |
| BSI BS 9220 N004 | EN-Detail Specification for Circular Waveguide Tubing of Assessed Quality. General Application Category | |
| BSI BS 9300 C199-276 | EN-Electronic parts of assessed quality - Silicon voltage-regulator diodes | |
| BSI BS 9300 C377-378 | EN-Electronic parts of assessed quality - Silicon coaxial mixer diodes | |
| BSI BS 9300 C379-388 | EN-Electronic parts of assessed quality - Silicon stud mounted power rectifier diodes | |
| BSI BS 9300 C405-429 | EN-Electronic parts of assessed quality - Silicon voltage-regulator diodes | |
| BSI BS 9300 C476 | EN-Electronic parts of assessed quality - Silicon avalanche rectifier diode | |
| BSI BS 9300 C534 | EN-Electronic parts of assessed quality - Silicon coaxial resistive switching diode | |
| BSI BS 9300 C582-584 | EN-Electronic parts of assessed quality - Reverse blocking triode thyristors | |
| BSI BS 9300 C599 | EN-Electronic parts of assessed quality - Silicon microwave switching diode rod mounted | |
| BSI BS 9300 C667-668 | EN-Electronic parts of assessed quality - Silicon avalance rectifier diode | |
| BSI BS 9300 C678-721 | EN-Electronic parts of assessed quality - silicon voltage regulator diodes |